Test beam data from CiS and Tesla preproduction sensors have been analyzed.
Sensors have:
Results:
CiS
Tesla
Charge profiles CiS Tesla Charge distribution CiS Tesla
Comparison of TOT calibration Tesla - CiS
Comparison of TOT calibration between CiS chips
Conclusions:
Uniform charge collection over the full pixel surface, except a ~20% charge loss in a restricted zone around the bias dot.
No difference between the two sensors, within the uncertainty of TOT calibration.
Waiting for an absolute TOT scale calibration.
Clara Troncon